BRAND | Ingun |
Product | BIT-GKS-112M-B |
Description | Insertion and Extraction Tool |
Internal code | ONR4501854 |
Custom code | 85389099 |
Discover the superior quality and performance of the Ingun BIT-GKS-112M-B with Onrion LLC in Chile . Whether you are looking for reliability or efficiency, this product meets all your industrial needs.
The BIT-GKS-112M-B is designed to provide optimal performance and durability in various applications. Known for its high-quality construction and innovative features, it is a preferred choice for professionals.
Key Features of BIT-GKS-112M-B :
At Onrion LLC , we offer the BIT-GKS-112M-B at competitive prices and with the fastest delivery times across Chile . Our expert team is ready to assist you with all your inquiries and provide tailored solutions to meet your specific needs.
Why Choose Onrion LLC ?
Get Your Quote Today! Ready to enhance your operations with the BIT-GKS-112M-B ? Contact us now for a personalized quote. Fill out the form below or send us an email with your inquiry. Let us help you make a cost-effective, quality-driven choice for your business.
Important Notice: While we supply Ingun products, Onrion LLC is not an authorized distributor. All rights are reserved by the manufacturers and their official partners.
Receptacle, silver-plated
Cushioned contact pin
Contact socket
Cushioned contact pin
Cushioned contact pin
Insertion and Extraction Tool
Torque wrench 20-120 Ncm
Torque wrench 5-40 cNm
GKS-100-0007 / GKS-100 305 090 A 2000
Spring-loaded test probe
Cushioned contact pin
Contact socket A
GKS-967 306 130 A 2001 / GKS-967-0015
Spring loaded test tip
GKS-001-0003/ GKS-001 306 100 A 1000
Spring-loaded test probe
Socket for KT-150-L3-M3
Socket for KT-254
Spring-loaded test probe
GKS-075-0084 / GKS-075 305 064 A 1500
Spring-loaded test probe
GKS-002-0009 / GKS-002 303 191 A 1800
Spring-loaded test probe
Spring-loaded test probe
High-current probe
Spring-loaded test probe
Electric LED analyzer
High-current probe
GKS-113-0514 / GKS-113 306 230 A 3005
Spring-loaded test probe